Trace analysis of semiconductor materials.
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Trace analysis of semiconductor materials.

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Published by Pergamon Press; [distributed in the Western Hemisphere by Macmillan, New York] in Oxford, New York .
Written in English


  • Semiconductors.,
  • Trace analysis.

Book details:

Edition Notes

Includes bibliographies.

SeriesInternational series of monographs on analytical chemistry,, v. 11, International series of monographs on analytical chemistry ;, v. 11.
LC ClassificationsQD939 .C26 1964
The Physical Object
Paginationix, 282 p.
Number of Pages282
ID Numbers
Open LibraryOL5886447M
LC Control Number63018922

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Additional Physical Format: Online version: Cali, J. Paul. Trace analysis of semiconductor materials. New York: Macmillan, (OCoLC) Document Type. Electronic books: Additional Physical Format: Print version: Cali, J. Paul, ed. Trace analysis of semiconductor materials (DLC) (OCoLC) Material Type: Document, Internet resource: Document Type: Internet Resource, Computer File: All Authors / Contributors: J Paul Cali. Semiconductor Materials Analysis and Fabrication Process Control A volume in European Materials Research Society Symposia Proceedings. Book • Edited by: Select Sputter induced resonant ionization spectroscopy for trace analysis in silicon. Book chapter Full text access.   For analytical chemists, materials scientists, chemists working in trace analysis, and spectroscopists. Author Bios Dr. David Pierce received his bachelor's degree in Chemistry at McGill University in and his Ph. D. in Analytical Chemistry in at the University of Vermont.

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